HP 4156B
Precision Semiconductor Parameter Analyzer /
정밀 반도체 파라미터 분석기

• 고해상도 / 정확성 및 넓은 범위. I : 1fA ~ 1A (20fA 오프셋 정확도), V : 1μV ~ 200V
• 직류 또는 펄스 모드의 완전 자동 IV 스위프 측정, 최대 6 SMU까지 확장 가능
• 동기 응력 / 측정 기능, 2 개의 고전압 펄스 발생기 (± 40V)
• 시간 영역 측정 : 60μS의 가변 간격, 최대 10,001 포인트
• 사용하기 쉽습니다 : 커브 추적기와 유사한 노브 스위프, 자동 분석 기능
• 자동화 : 내장 HP 장비 기본, 트리거 I / O 기능

4156B는 애질런트의 반도체 파라미터 분석기입니다. 반도체 파라미터 분석기는 광범위한 측정 기능에 사용되는 올인원 툴입니다. 반도체 매개 변수 분석기는 다양한 유형의 전자 장치, 재료, 능동 또는 수동 구성 요소, 반도체 또는 기타 전자 장치의 전기적 특성을 측정하고 분석 할 수 있습니다. 엔지니어는 여러 유형의 장치에서 전류 및 전압 응답을 모니터링하기 위해이 테스트 장비를 사용합니다.

The Agilent HP 4156B are the next generation in precision semiconductor parameter analyzers. You get the best digital sweep parameter analyzer plus a reliability tester, powerful failure-analysis tool, and automated incoming inspection station, all rolled into a single instrument.
This new family was explicitly designed to provide unprecedented accuracy and functionality for evaluating your sub-micron geometry devices. With one flexible instrument, you can improve your semi-conductor quality starting from material evaluation and dev ice characterization all the way through final packaged part inspection and field failure analysis.

The Agilent HP 4156B offers four built-in source/monitor units (SMUs), two voltage source units (VSUs), and two voltage monitor units (VMUs). The Agilent HP 4156B extends current resolution to 1 fA and accuracy to 20 fA. The HP 4156B utilizes full-kelvin remote sensing on each SMU.

At any time, you can add the Agilent HP 4150 1B SMU and Pulse Generator Expander, which is supplied with a 0V/1.6 A Ground Unit. The expander accepts two 10 0 mA/100 VSMUs or one 1A/200V SMU, and two specially-synchronized 40V/200 mA/1 µs pulse generators.

Setup and Measurement
The Agilent HP 4156B can perform staircase and pulse sweep measurement, and sampling (time-domain) measurement using many measurement units, including units in the Agilent HP 41501B, without changing connections. Moreover, you can easily perform stress-measure cycling test for reliability evaluation such as hot carrier injection and flash EEPROM test.

Setup and measurement are made by setting up pages and filling in the blanks from front-panel keys, keyboard, or GPIB (SCPI commands). You can also instantly measure and find setup conditions by using knob sweep capability, which is similar to curvetracer operation.

Display and Analysis
The measurement and analysis results are displayed on the color LCD, and you can superimpose stored graphics from four graphic memories for comparison. A number of powerful graphical analysis tools make it easy to analyze and extract many parameters such as hFE and Vth.

Once you find the parameter extraction conditions, you can automatically get the parameter by using the automatic analysis function.

Output and Storage
Setup, measurement, and analysis data can be output via GPIB, parallel or network interface 10 Base-TLAN to a color plotter and printer. You can also save the data onto a disk via network or 3.5-inch disk in MS-DOS or LIF format. Graphic (HP-GL, PCL or TIF) output file allows you to transfer graphics to desktop publishing software.

Repeating and Automating Tests
The Agilent HP Instrument BASIC controller built into the HP 4156B can construct an automatic measurement system using external instruments without a controller. The Agilent HP 4156B can be synchronized with external instruments by the versatile trigger I/O functions.

Agilent 16442A
Test Fixture for 4155 or 4156 / 4155 or 4156용 테스트장치

The Agilent 16442A Test Fixture is designed for testing electronic devices. The user mounts the suitable socket module on the 16442A, which allows the user to easily connect various devices (DUTs) to measurement units. The 16442A has thirteen channels:

• 6 source/monitor unit (SMU) channels - Up to 3 channels can be connected to SMUs by Kelvin connections.
• 2 voltage source unit (VSU) channels
• 2 voltage monitor unit (VMU) channels
• 2 pulse generator unit (PGU) channels
• 1 ground unit (GNDU) channel

• for 4155 or 4156